Draft ISO specification for SEM and AFM measurement of graphene oxide advances
Draft ISO/DTS 23879 reached the final approval stage on 27 October 2026; it has not yet been published as a technical specification.
ISO/DTS 23879, developed by ISO/TC 229, advanced to stage 50.20 on 27 October 2026. The draft addresses lateral-size measurement of graphene oxide flakes by scanning electron microscopy and thickness measurement by atomic force microscopy, including preparation, measurement and data analysis for powders and liquid dispersions.
The free abstract does not establish the detailed conditions or reporting requirements. Laboratories evaluating graphene oxide should compare their preparation and image-analysis procedures with the final text when it is published. No mandatory method change or transition period has been set.